Yuri A. Stepchenkov, Anton N. Kamenskih, Yuri G. Diachenko, Yuri V. Rogdestvenski, and Denis Y. Diachenko. Fault-Tolerance of the Self-Timed Circuits // 2019 10th International Conference on Dependable Systems, Services and Technologies (DESSERT). (indexed in Scopus). DOI: 10.1109/DESSERT.2019.8770047.
Abstract—the paper discusses a fault-tolerance problem for digital integrated circuits. Due to their properties, self-timed circuits, unlike synchronous counterparts, are immune towards the greater part of the short-term logical faults. Indication of an illegal state of the dual-rail signal as second spacer increases fault-tolerance of the combinational selftimed circuits up to 82%. Self-timed triggers, due to their indication features, are immune to 44% logical faults. The use of special methods of doubling transistors and bistable cells, which are the basis of the self-timed triggers, enhances their fault-tolerance up to 80%.