Increasing Self-Timed Circuit Soft Error Tolerance

YurIgor Sokolov, Yury Stepchenkov, Yury Diachenko, Yury Rogdestvenski, Denis Diachenko. Increasing Self-Timed Circuit Soft Error Tolerance // 2020 IEEE EAST-WEST DESIGN & TEST SYMPOSIUM Varna, Bulgaria, September 4 – 7, 2020, P. 450-454 . (is indexed in Scopus).

Abstract: Indication subcircuit is an essential part of the selftimed
circuits. It provides acknowledgment of the self-timed
circuit switching completion and ensures correct handshake
interaction between functional blocks. Besides, indication
subcircuit complexity is comparable with the indicated self-timed
circuit’s complexity. So short-term soft errors, induced by the
external and internal causes in both the indication subcircuit and
the indicated self-timed circuit, are equally dangerous. Indication
subcircuit soft error tolerance depends, the first, on its immunity
to soft errors in the indicated self-timed circuit and, the second, on
its failure protection. The first aspect becomes lower critical due
to the XOR cell on the first stage of the indication subcircuit. An
appropriate circuitry basis decreases indication subcircuit
sensitivity to the possible soft errors induced in it. Static and semistatic
Muller’s C-element is a traditional base component used for
indication purposes. Its dual interlocked implementation
improves the indication subcircuit failure protection against soft
errors in its internal nodes, but not sufficiently. The article
proposes a new C-element’s schematic that fully tolerates it
against the soft errors in all internal nodes. Besides, using Celements
with in-phase inputs and output in an indication
pyramid ensures indication subcircuit protection against soft
errors induced at the output of the C-elements. The proposed
approach makes an indication subcircuit fully protected against
all soft errors induced in it.

Дополнительную информацию о содержании доклада вы можете получить на сайте конференции или связавшись с авторами доклада / You can get additional information on the content of the article on the conference website or by contacting the authors of the article.

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